Applied Physics, Inc. provides specialized contamination wafer standards used to calibrate surface scanning inspection systems (SSIS) in the semiconductor manufacturing industry. These products utilize silica nanoparticles to ensure accurate particle detection and size calibration.
Corporate Websites semiconductor manufacturingwafer inspectioncalibration standardssilica nanoparticles
- Specialization
- Semiconductor Calibration Equipment
- Hosting Provider
- Cloudflare, Inc.
- Registered
- Apr 4, 2018